Laser Ablation ICP/MS Services |
Laser Ablation Inductively Coupled Plasma Mass Spectrometry identifies the elemental composition of materials
with the sensitivity to quantify trace elements in low parts per billion to parts per trillion. Solid particles
are ablated from the original sample by use of a high-powered Neodymium-YAG laser and transported to an RF induced
Argon plasma for ionization. The newly formed ions are then introduced into a mass spectrometer for
identification and quantization. The end result is unparalleled accuracy and precision with a wide spectrum of
effective applications. With Laser Ablation/ICP/MS, ORS offers a unique approach to elemental data analysis
that can be used to determine sample composition, and possible contamination identification, for the ever-changing
microelectronics and metallurgical industries.
The advantage of ICP/MS with Laser Ablation is that it offers in situ analysis of solid samples and demands
little to no sample preparation. This results in a very low risk of foreign contamination and allows small-scale
samples to be quantified. Both conductive and non-conductive materials can be ablated without the need for a conductive
coating or sample dissolution, and no vacuum is required either during the sampling or ionization steps.
Samples can be taken directly from the original specimen, at multiple locations, with only superficial
damage done to the surface. This is ideal for small feature analysis of complex structures or modules,
where lateral spatial resolution is essential. LA/ICP/MS can be used as a complimentary analysis technique to
FT-IR, GC/MS, and/or EDX, when high resolution quantification data and multi-source data correlation are necessary.
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Capabilities:
Digital imaging
Element identification ranging from 7amu - 350 amu
Image analysis and measurement software
Resolution in parts per trillion
Variable client-specific sample acquisition areas
Varying LASER spot/sample sizes (5 µm - 250 µm)
Advantages:
High-speed profiling of laminar structures
Moveable stage for lateral resolution
Multi-step ionization process for added control and flexibility
No vacuum or conductive coating necessary
Virtually no sample prep; low risk of contamination
Industries:
Aerospace
Automotive
Commercial
Medical
Metallurgical
Microelectronic
Applications:
Contamination identification
Elemental analysis
Elemental quantification
Failure Analysis
Process and Quality Control
Reliability
Instrumentation:
500 - Laser Ablation System (Neodymium-YAG)
Micromass Platform ICP
As the push for the European RoHS initiative grows to include the microelectronic
industry on a global scale, ORS and its industry experts can also help ensure that
RoHS compliance is obtained.
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