ORS is please to announce the addition of an SII Nano Technology SEA 5120 X-ray
Fluorescence system to our analytical services. This instrument utilizes the latest SII Nano Technology software and has the rare
Ultra Thin Window (UTW) option Si(Li) Semiconductor Detector and Vacuum test chamber. This new addition provides superior
sensitivity and an expanded elemental range (C – U) when compare to standard traditional XRF systems.
Oneida Research Services, Inc. has been approved to perform Destructive Physical Analysis (DPA) and Residual Gas Analysis (RGA) testing for the next generation GPS III program. The U.S. Air Force’s Global Positioning System (GPS) III program was awarded to the Lockheed Martin-led team in May 2008. For more information, please see Defense News Website
Please contact Debbie Delluomo at 315 736-5480 ext 2228 for more information
ORS presents a paper titled “Measuring Mass flows in hermetically sealed
MEMs & MOEMs to ensure device reliability” at the January, 2008 SPIE conference in San Jose, CA
ORS announces its High Resolution Internal Vapor Analyzer (HR-IVA) for small volume (<0.01cc) package gas analysis at Aerospace Corp’s Space Parts Working Group Conference April 4th, 2006.
ORS is pleased to announce the addition of reflow soldering and moisture sensitivity (JEDEC J-STD-020C) analytical capabilities on devices intended for Surface Mount Technology applications. August 2005.
Defense
Supply Center Columbus (DSCC) has expanded ORS
Suitability status for MIL-STD-883, method 1018.
Package volumes with an internal cavity greater
than 0.01cc may be tested. ORS is now the only laboratory
suitable to test hybrid packages greater than 20cc.