h o m e    p a g e
ANALYTICAL SERVICES
Analytical Testing Services
GAS ANALYSIS
Internal Vapor Analysis
(IVA™)
High Resolution IVA
(HR-IVA™)
Hermeticity Testing
Material Outgassing Studies
IVA™ Instrument Sales
Organic Mass Spectrometry
COMPONENT ANALYSIS
Construction Analysis
Destructive Physical Analysis
Micro FT-IR
Failure Analysis
Surface Analysis
Laser Ablation ICP/MS
Acoustic Microscopy
Real Time X-ray Inspection
Scanning Electron Spectroscopy
Auger Electron Spectroscopy
Environmental Testing
XRF Elemental Analysis
Counterfeit Device Screening
CONSULTING SERVICES
Areas of Expertise
SUBMISSION FORMS
Gas Analysis Form
Componet Analysis Form
CLIENT LOGIN
Login

8282 Halsey Road
Whitesboro, NY 13492
Phone: (315) 736-5480
Fax: (315) 736-9321


For further information,
please contact:
Deborah Delluomo
Phone: (315) 736-5480 ext. 2202

mail to:dadelluomo@ors-labs.com

News

ORS is please to announce the addition of an SII Nano Technology SEA 5120 X-ray Fluorescence system to our analytical services. This instrument utilizes the latest SII Nano Technology software and has the rare Ultra Thin Window (UTW) option Si(Li) Semiconductor Detector and Vacuum test chamber. This new addition provides superior sensitivity and an expanded elemental range (C – U) when compare to standard traditional XRF systems.   More info...
Current DSCC Commercial Laboratory Suitability Letter for MIL-STD-883 and MIL-STD-750, Method 1018.
  
  • MIL-STD-883: Suitable to test devices with 0.01cc to infinite volume.
  •   
  • MIL-STD-750: Suitable to test devices with 0.01cc to 20cc volume.
  •   Suitability Letter (.pdf)
    Oneida Research Services, Inc. has been approved to perform Destructive Physical Analysis (DPA) and Residual Gas Analysis (RGA) testing for the next generation GPS III program. The U.S. Air Force’s Global Positioning System (GPS) III program was awarded to the Lockheed Martin-led team in May 2008. For more information, please see Defense News Website

    Please contact Debbie Delluomo at 315 736-5480 ext 2228 for more information
      Defense News Website
    ORS presents a paper titled “Measuring Mass flows in hermetically sealed MEMs & MOEMs to ensure device reliability” at the January, 2008 SPIE conference in San Jose, CA
      SPIE Paper(.pdf)
    ORS announces its High Resolution Internal Vapor Analyzer (HR-IVA™) for small volume (<0.01cc) package gas analysis at Aerospace Corp’s Space Parts Working Group Conference April 4th, 2006.   More info ....
    ORS is pleased to announce the addition of reflow soldering and moisture sensitivity (JEDEC J-STD-020C) analytical capabilities on devices intended for Surface Mount Technology applications.
    August 2005.
      More info ....

    ORS presents invited paper on Moisture Analysis at January 2004 JEDEC meeting in Phoenix, Arizona.

    Moisture Paper (.pdf)

    ORS acquires advanced Micro FT-IR capabilities for analysis of board level contaminants as small as 10 microns in size.
    January 1, 2004.

    More info...

    Defense Supply Center Columbus (DSCC) has expanded ORS’ Suitability status for MIL-STD-883, method 1018. Package volumes with an internal cavity greater than 0.01cc may be tested. ORS is now the only laboratory suitable to test hybrid packages greater than 20cc.

    Suitability Letter (.pdf)


    Note: To view PDF files you must have Adobe Acrobat Reader® loaded on your system!
        
    Click here to download FREE software!

     

    All rights Reserved, Copyright, Oneida Research Services, Inc.