Current DLA Land and Maritime Commercial Laboratory Suitability Letter:
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New York Office: Suitability Letter (.pdf) |
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Colorado Office: Suitability Letter (.pdf) |
Internal Gas Analysis
° Mil-Std-883, Method 1018: Suitable to test devices with 0.001cc to infinite volume.
° Mil-Std-750, Method 1018: Suitable to test devices with 0.001cc to 20cc volume.
Seal
° Mil-Std-883, Method 1014: Kr-85 condition B1, B2, B1/B2.
° Mil-Std-750, Method 1071: Kr-85 condition A1, G1, G2, G1/G2.
Radiography
° Mil-Std-883, Method 2012: Film and Non-Film (Real-time digital).
° Mil-Std-750, Method 2076: Film and Non-Film (Real-time digital).
SEM
° Mil-Std-883, Method 2018: SEM Metallization Inspection / Wafer Lot Acceptance.
° Mil-Std-750, Method 2077: SEM Metallization Inspection / Wafer Lot Acceptance.
PIND
° Mil-Std-883, Method 2020: Condition A and B.
° Mil-Std-750, Method 2052: Condition A and B.
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ORS is pleased to announce the addition of an SII Nano Technology SEA 5120 X-ray
Fluorescence system to our analytical services. This instrument utilizes the latest SII Nano Technology software and has the rare
Ultra Thin Window (UTW) option Si(Li) Semiconductor Detector and Vacuum test chamber. This new addition provides superior
sensitivity and an expanded elemental range (C – U) when compare to standard traditional XRF systems.
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More info... |
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Oneida Research Services, Inc. has been approved to perform Destructive Physical Analysis (DPA) and Residual Gas Analysis (RGA) testing for the next generation GPS III program. The U.S. Air Force’s Global Positioning System (GPS) III program was awarded to the Lockheed Martin-led team in May 2008. For more information, please see Defense News Website
Please contact Debbie Delluomo at 315 736-5480 ext 2228 for more information
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Defense News Website |
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ORS presents a paper titled “Measuring Mass flows in hermetically sealed
MEMs & MOEMs to ensure device reliability” at the January, 2008 SPIE conference in San Jose, CA
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SPIE Paper(.pdf) |
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| ORS announces its High Resolution Internal Vapor Analyzer (HR-IVA™) for small volume (<0.01cc) package gas analysis at Aerospace Corp’s Space Parts Working Group Conference April 4th, 2006. |
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ORS is pleased to announce the addition of reflow soldering and moisture sensitivity (JEDEC J-STD-020C) analytical capabilities on devices intended for Surface Mount Technology applications.
August 2005. |
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More
info .... |
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ORS presents invited paper on Moisture Analysis at January 2004 JEDEC meeting in Phoenix, Arizona. |
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Moisture Paper (.pdf) |
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ORS acquires advanced Micro FT-IR capabilities for analysis of board level contaminants as small as 10 microns in size.
January 1, 2004. |
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More info... |
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