ORS offers a wide range of analytical techniques for material evaluation, process monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases, organics and inorganics. Our scientific staff will recommend the analytical technique that will best meet your requirements.

Surface Analysis Techniques:
Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces.

Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted, determining variations in elemental compositions with depth.

Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)